Ray Tracing Simulation of X-ray Microdiffraction Beamline on the Inverse Compton Source

This paper deals with the simulation of output beam parameters inverse Compton X-ray Source (ICS). The takes into account main laser and electron beams, such as their pulse shapes, polarization properties well angular energy dispersion electrons. layout presented ICS optical beamline is dedicated to micro-diffraction studies. To maintain axial symmetry beams at different photon energies, monochromator based on a single crystal installed in Borrmann transparency condition.